MX25L3205 and W25x40 have been confirmed to probe/read/erase/write OK by Harald Gutmann

SST39VF040 has been confirmed to probe OK by misi e.

Corresponding to flashrom svn r226 and coreboot v2 svn r3300.

Signed-off-by: Carl-Daniel Hailfinger <c-d.hailfinger.devel.2006@gmx.net>
Acked-by: Carl-Daniel Hailfinger <c-d.hailfinger.devel.2006@gmx.net>
diff --git a/flash.h b/flash.h
index da155ed..6a1475e 100644
--- a/flash.h
+++ b/flash.h
@@ -66,6 +66,7 @@
 #define TEST_OK_READ	(1<<1)
 #define TEST_OK_ERASE	(1<<2)
 #define TEST_OK_WRITE	(1<<3)
+#define TEST_OK_PREW	(TEST_OK_PROBE|TEST_OK_READ|TEST_OK_ERASE|TEST_OK_WRITE)	
 #define TEST_OK_MASK	0x0f
 
 #define TEST_BAD_PROBE	(1<<4)
diff --git a/flashchips.c b/flashchips.c
index 085a4a7..b26b438 100644
--- a/flashchips.c
+++ b/flashchips.c
@@ -49,7 +49,7 @@
 	{"Fujitsu",	"MBM29F400TC",		FUJITSU_ID,	MBM29F400TC_STRANGE,	512,	64 * 1024,	TEST_UNTESTED,	probe_m29f400bt,	erase_m29f400bt,		write_coreboot_m29f400bt},
 	{"Intel",	"82802AB",		INTEL_ID,	173,			512,	64 * 1024,	TEST_UNTESTED,	probe_82802ab,		erase_82802ab,			write_82802ab},
 	{"Intel",	"82802AC",		INTEL_ID,	172,			1024,	64 * 1024,	TEST_UNTESTED,	probe_82802ab,		erase_82802ab,			write_82802ab},
-	{"Macronix",	"MX25L3205",		MX_ID,		MX_25L3205,		4096,	256,		TEST_UNTESTED,	probe_spi,		spi_chip_erase_c7,	spi_chip_write,	spi_chip_read},
+	{"Macronix",	"MX25L3205",		MX_ID,		MX_25L3205,		4096,	256,		TEST_OK_PREW,	probe_spi,		spi_chip_erase_c7,	spi_chip_write,	spi_chip_read},
 	{"Macronix",	"MX25L4005",		MX_ID,		MX_25L4005,		512,	256,		TEST_UNTESTED,	probe_spi,		spi_chip_erase_c7,	spi_chip_write,	spi_chip_read},
 	{"Macronix",	"MX25L8005",		MX_ID,		MX_25L8005,		1024,	256,		TEST_UNTESTED,	probe_spi,		spi_chip_erase_c7,	spi_chip_write,	spi_chip_read},
 	{"Macronix",	"MX29F002",		MX_ID,		MX_29F002,		256,	64 * 1024,	TEST_UNTESTED,	probe_29f002,		erase_29f002,			write_29f002},
@@ -76,7 +76,7 @@
 	{"SST",		"SST39VF512",		SST_ID,		SST_39VF512,		64,	4096,		TEST_UNTESTED,	probe_jedec,		erase_chip_jedec,		write_39sf020},
 	{"SST",		"SST39VF010",		SST_ID,		SST_39VF010,		128,	4096,		TEST_UNTESTED,	probe_jedec,		erase_chip_jedec,		write_39sf020},
 	{"SST",		"SST39VF020",		SST_ID,		SST_39VF020,		256,	4096,		TEST_UNTESTED,	probe_jedec,		erase_chip_jedec,		write_39sf020},
-	{"SST",		"SST39VF040",		SST_ID,		SST_39VF040,		512,	4096,		TEST_UNTESTED,	probe_jedec,		erase_chip_jedec,		write_39sf020},
+	{"SST",		"SST39VF040",		SST_ID,		SST_39VF040,		512,	4096,		TEST_OK_PROBE,	probe_jedec,		erase_chip_jedec,		write_39sf020},
 // assume similar to 004B, ignoring data sheet
 	{"SST",		"SST49LF002A/B",	SST_ID,		SST_49LF002A,		256,	16 * 1024,	TEST_UNTESTED,	probe_sst_fwhub,	erase_sst_fwhub,		write_sst_fwhub},
 	{"SST",		"SST49LF003A/B",	SST_ID,		SST_49LF003A,		384,	64 * 1024,	TEST_UNTESTED,	probe_sst_fwhub,	erase_sst_fwhub,		write_sst_fwhub},
@@ -119,7 +119,7 @@
 	{"SyncMOS",	"S29C51004T",		SYNCMOS_ID,	S29C51004T,		512,	128,		TEST_UNTESTED,	probe_jedec,		erase_chip_jedec,		write_49f002},
 	{"Winbond",	"W25x10",		WINBOND_NEX_ID,	W_25X10,		128,	256,		TEST_UNTESTED,	probe_spi,		spi_chip_erase_c7,	spi_chip_write, spi_chip_read},
 	{"Winbond",	"W25x20",		WINBOND_NEX_ID,	W_25X20,		256,	256,		TEST_UNTESTED,	probe_spi,		spi_chip_erase_c7,	spi_chip_write, spi_chip_read},
-	{"Winbond",	"W25x40",		WINBOND_NEX_ID,	W_25X40,		512,	256,		TEST_UNTESTED,	probe_spi,		spi_chip_erase_c7,	spi_chip_write, spi_chip_read},
+	{"Winbond",	"W25x40",		WINBOND_NEX_ID,	W_25X40,		512,	256,		TEST_OK_PREW,	probe_spi,		spi_chip_erase_c7,	spi_chip_write, spi_chip_read},
 	{"Winbond",	"W25x80",		WINBOND_NEX_ID,	W_25X80,		1024,	256,		TEST_UNTESTED,	probe_spi,		spi_chip_erase_c7,	spi_chip_write, spi_chip_read},
 	{"Winbond",	"W29C011",		WINBOND_ID,	W_29C011,		128,	128,		TEST_UNTESTED,	probe_jedec,		erase_chip_jedec,		write_jedec},
 	{"Winbond",	"W29C020C",		WINBOND_ID,	W_29C020C,		256,	128,		TEST_UNTESTED,	probe_jedec,		erase_chip_jedec,		write_jedec},