)]}'
{
  "commit": "eaac68bf8be13ff4cfe2b58119c766357a37d417",
  "tree": "67c75e22deb5b6a1ae1a2dcf2f152fce1843c647",
  "parents": [
    "a2441cef65161f5d5b4b7a80de8379173a0d04cc"
  ],
  "author": {
    "name": "Carl-Daniel Hailfinger",
    "email": "c-d.hailfinger.devel.2006@gmx.net",
    "time": "Mon Nov 23 12:55:31 2009 +0000"
  },
  "committer": {
    "name": "Carl-Daniel Hailfinger",
    "email": "c-d.hailfinger.devel.2006@gmx.net",
    "time": "Mon Nov 23 12:55:31 2009 +0000"
  },
  "message": "Add the ability to generate test patterns for write testing\n\nThis will be useful once we create a --test function for flashrom.\n\nThe test patterns make it easy to find skipped and duplicated bytes, are\nhuman readable, and the first 8 of them have block numbers to detect\naliasing or wraparounds. Current size limit for aliasing detection is\n16 MByte, but since neither LPC nor FWH nor SPI chips exist with bigger\nsizes, this is reasonably safe.\n\nDetailed documentation is available as source code comments above the\nnew function generate_testpattern().\n\nCorresponding to flashrom svn r770.\n\nSigned-off-by: Carl-Daniel Hailfinger \u003cc-d.hailfinger.devel.2006@gmx.net\u003e\nAcked-by: Maciej Pijanka \u003cmaciej.pijanka@gmail.com\u003e\n",
  "tree_diff": [
    {
      "type": "modify",
      "old_id": "6f302bb3b1cf1e25dfbe9595caa5919112ceb11a",
      "old_mode": 33188,
      "old_path": "flashrom.c",
      "new_id": "c4cfeef6e0f770ea58867d68daa205485b89ae83",
      "new_mode": 33188,
      "new_path": "flashrom.c"
    }
  ]
}