Add the ability to generate test patterns for write testing
This will be useful once we create a --test function for flashrom.
The test patterns make it easy to find skipped and duplicated bytes, are
human readable, and the first 8 of them have block numbers to detect
aliasing or wraparounds. Current size limit for aliasing detection is
16 MByte, but since neither LPC nor FWH nor SPI chips exist with bigger
sizes, this is reasonably safe.
Detailed documentation is available as source code comments above the
new function generate_testpattern().
Corresponding to flashrom svn r770.
Signed-off-by: Carl-Daniel Hailfinger <c-d.hailfinger.devel.2006@gmx.net>
Acked-by: Maciej Pijanka <maciej.pijanka@gmail.com>
1 file changed