Random flashrom updates
- Add explicit installation instructions in the README.
- Code cleanups, coding style fixes, drop dead code.
- Drop duplicate board listings from -L output (some boards were explicitly
recorded in boards_ok[] _and_ implicitly via the board-enables table.
- Add MS-xxxx numbers to MSI boards where we can find that info.
- Fix typo, "K8T Neo2" should have been "K8T Neo2-F" actually, at least
according to the comment of w83627thf_gpio4_4_raise_2e() which says
"Suited for: MSI K8T Neo2-F".
Corresponding to flashrom svn r554.
Signed-off-by: Uwe Hermann <uwe@hermann-uwe.de>
Acked-by: Uwe Hermann <uwe@hermann-uwe.de>
diff --git a/flash.h b/flash.h
index 15b0636..3151646 100644
--- a/flash.h
+++ b/flash.h
@@ -92,7 +92,8 @@
int (*init) (void);
int (*shutdown) (void);
- void * (*map_flash_region) (const char *descr, unsigned long phys_addr, size_t len);
+ void * (*map_flash_region) (const char *descr, unsigned long phys_addr,
+ size_t len);
void (*unmap_flash_region) (void *virt_addr, size_t len);
void (*chip_writeb) (uint8_t val, chipaddr addr);
@@ -151,20 +152,20 @@
#define TEST_UNTESTED 0
-#define TEST_OK_PROBE (1<<0)
-#define TEST_OK_READ (1<<1)
-#define TEST_OK_ERASE (1<<2)
-#define TEST_OK_WRITE (1<<3)
-#define TEST_OK_PR (TEST_OK_PROBE|TEST_OK_READ)
-#define TEST_OK_PRE (TEST_OK_PROBE|TEST_OK_READ|TEST_OK_ERASE)
-#define TEST_OK_PREW (TEST_OK_PROBE|TEST_OK_READ|TEST_OK_ERASE|TEST_OK_WRITE)
+#define TEST_OK_PROBE (1 << 0)
+#define TEST_OK_READ (1 << 1)
+#define TEST_OK_ERASE (1 << 2)
+#define TEST_OK_WRITE (1 << 3)
+#define TEST_OK_PR (TEST_OK_PROBE | TEST_OK_READ)
+#define TEST_OK_PRE (TEST_OK_PROBE | TEST_OK_READ | TEST_OK_ERASE)
+#define TEST_OK_PREW (TEST_OK_PROBE | TEST_OK_READ | TEST_OK_ERASE | TEST_OK_WRITE)
#define TEST_OK_MASK 0x0f
-#define TEST_BAD_PROBE (1<<4)
-#define TEST_BAD_READ (1<<5)
-#define TEST_BAD_ERASE (1<<6)
-#define TEST_BAD_WRITE (1<<7)
-#define TEST_BAD_PREW (TEST_BAD_PROBE|TEST_BAD_READ|TEST_BAD_ERASE|TEST_BAD_WRITE)
+#define TEST_BAD_PROBE (1 << 4)
+#define TEST_BAD_READ (1 << 5)
+#define TEST_BAD_ERASE (1 << 6)
+#define TEST_BAD_WRITE (1 << 7)
+#define TEST_BAD_PREW (TEST_BAD_PROBE | TEST_BAD_READ | TEST_BAD_ERASE | TEST_BAD_WRITE)
#define TEST_BAD_MASK 0xf0
extern struct flashchip flashchips[];
@@ -534,7 +535,7 @@
* byte of device ID is related to log(bitsize).
*/
#define WINBOND_ID 0xDA /* Winbond */
-#define WINBOND_NEX_ID 0xEF /* Winbond (ex Nexcom) serial flash devices */
+#define WINBOND_NEX_ID 0xEF /* Winbond (ex Nexcom) serial flashes */
#define W_25X10 0x3011
#define W_25X20 0x3012
#define W_25X40 0x3013
@@ -659,8 +660,6 @@
/* nic3com.c */
int nic3com_init(void);
int nic3com_shutdown(void);
-void *nic3com_map(const char *descr, unsigned long phys_addr, size_t len);
-void nic3com_unmap(void *virt_addr, size_t len);
void nic3com_chip_writeb(uint8_t val, chipaddr addr);
uint8_t nic3com_chip_readb(const chipaddr addr);
extern struct pcidev_status nics_3com[];
@@ -668,8 +667,6 @@
/* satasii.c */
int satasii_init(void);
int satasii_shutdown(void);
-void *satasii_map(const char *descr, unsigned long phys_addr, size_t len);
-void satasii_unmap(void *virt_addr, size_t len);
void satasii_chip_writeb(uint8_t val, chipaddr addr);
uint8_t satasii_chip_readb(const chipaddr addr);
extern struct pcidev_status satas_sii[];
@@ -850,7 +847,8 @@
/* wbsio_spi.c */
int wbsio_check_for_spi(const char *name);
-int wbsio_spi_command(unsigned int writecnt, unsigned int readcnt, const unsigned char *writearr, unsigned char *readarr);
+int wbsio_spi_command(unsigned int writecnt, unsigned int readcnt,
+ const unsigned char *writearr, unsigned char *readarr);
int wbsio_spi_read(struct flashchip *flash, uint8_t *buf);
int wbsio_spi_write_1(struct flashchip *flash, uint8_t *buf);