Fix typo in r3615 (TEST_PREW -> TEST_OK_PREW)
Corresponding to flashrom svn r318 and coreboot v2 svn r3616.
Signed-off-by: Peter Stuge <peter@stuge.se>
Acked-by: Peter Stuge <peter@stuge.se>
diff --git a/flashchips.c b/flashchips.c
index c4a79fd..5ad5665 100644
--- a/flashchips.c
+++ b/flashchips.c
@@ -120,7 +120,7 @@
{"ST", "M50LPW116", ST_ID, ST_M50LPW116, 2048, 64 * 1024, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_jedec},
{"SyncMOS", "S29C31004T", SYNCMOS_ID, S29C31004T, 512, 128, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_49f002},
{"SyncMOS", "S29C51001T", SYNCMOS_ID, S29C51001T, 128, 128, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_49f002},
- {"SyncMOS", "S29C51002T", SYNCMOS_ID, S29C51002T, 256, 128, TEST_PREW, probe_jedec, erase_chip_jedec, write_49f002},
+ {"SyncMOS", "S29C51002T", SYNCMOS_ID, S29C51002T, 256, 128, TEST_OK_PREW, probe_jedec, erase_chip_jedec, write_49f002},
{"SyncMOS", "S29C51004T", SYNCMOS_ID, S29C51004T, 512, 128, TEST_UNTESTED, probe_jedec, erase_chip_jedec, write_49f002},
{"Winbond", "W25x10", WINBOND_NEX_ID, W_25X10, 128, 256, TEST_UNTESTED, probe_spi_rdid, spi_chip_erase_c7, spi_chip_write, spi_chip_read},
{"Winbond", "W25x20", WINBOND_NEX_ID, W_25X20, 256, 256, TEST_UNTESTED, probe_spi_rdid, spi_chip_erase_c7, spi_chip_write, spi_chip_read},