diff --git a/flash.h b/flash.h
index cbc2e48..70a390f 100644
--- a/flash.h
+++ b/flash.h
@@ -95,6 +95,7 @@
 #define TEST_BAD_READ	(1<<5)
 #define TEST_BAD_ERASE	(1<<6)
 #define TEST_BAD_WRITE	(1<<7)
+#define TEST_BAD_PREW	(TEST_BAD_PROBE|TEST_BAD_READ|TEST_BAD_ERASE|TEST_BAD_WRITE)
 #define TEST_BAD_MASK	0xf0
 
 extern struct flashchip flashchips[];
@@ -106,7 +107,7 @@
  *
  * All LPC/FWH parts (parallel flash) have 8-bit device IDs if there is no
  * continuation code.
- * All SPI parts have 16-bit device IDs.
+ * SPI parts have 16-bit device IDs if they support RDID.
  */
 
 #define GENERIC_DEVICE_ID	0xffff	/* Only match the vendor ID */
diff --git a/flashrom.c b/flashrom.c
index 9357d04..5e84134 100644
--- a/flashrom.c
+++ b/flashrom.c
@@ -499,15 +499,19 @@
 			if (flash->tested & TEST_BAD_WRITE)
 				printf(" WRITE");
 			printf("\n");
-		} else {
+		}
+		if ((!(flash->tested & TEST_BAD_PROBE) && !(flash->tested & TEST_OK_PROBE)) ||
+		    (!(flash->tested & TEST_BAD_READ) && !(flash->tested & TEST_OK_READ)) ||
+		    (!(flash->tested & TEST_BAD_ERASE) && !(flash->tested & TEST_OK_ERASE)) ||
+		    (!(flash->tested & TEST_BAD_WRITE) && !(flash->tested & TEST_OK_WRITE))) {
 			printf("This flash part has status UNTESTED for operations:");
-			if (!(flash->tested & TEST_OK_PROBE))
+			if (!(flash->tested & TEST_BAD_PROBE) && !(flash->tested & TEST_OK_PROBE))
 				printf(" PROBE");
-			if (!(flash->tested & TEST_OK_READ))
+			if (!(flash->tested & TEST_BAD_READ) && !(flash->tested & TEST_OK_READ))
 				printf(" READ");
-			if (!(flash->tested & TEST_OK_ERASE))
+			if (!(flash->tested & TEST_BAD_ERASE) && !(flash->tested & TEST_OK_ERASE))
 				printf(" ERASE");
-			if (!(flash->tested & TEST_OK_WRITE))
+			if (!(flash->tested & TEST_BAD_WRITE) && !(flash->tested & TEST_OK_WRITE))
 				printf(" WRITE");
 			printf("\n");
 		}